发明名称 BURST LENGTH CONTROL CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a burst length control circuit and a semiconductor memory device using the same. SOLUTION: The burst length control circuit includes: a clock signal generating section that generates first and second internal clock signals from a clock signal in response to first and second burst signals, a control signal generating section that is driven in response to the first and second internal clock signals and that generates first and second control signals whose enable region is adjusted by the first and second burst signals upon read or write operation, and a burst end signal generating section that generates a burst end signal in response to the first and second burst signals. The first control signal is disabled in response to the burst end signal. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010092577(A) 申请公布日期 2010.04.22
申请号 JP20080329849 申请日期 2008.12.25
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE JOO HYEON;LEE YIN-JAE
分类号 G11C11/4076;G11C11/407 主分类号 G11C11/4076
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