发明名称 PHOTORESIST COMPOSITIONS AND PROCESSESS OF USE
摘要 Photoresist compositions that demonstrate superior photolithographic performance and hardened resist films that show superior resistance to solvents, have excellent resistance to under plating during the electrodeposition of metals, and show excellent resist stripping characteristics. These photoresist compositions according to the invention are well-suited as for applications in the manufacture of MEMS and micromachine devices. These photoresist compositions according to the invention comprise one or more epoxide-substituted, polycarboxylic acid Resin Component (A), one or more photoacid generator compounds (B), and one or more solvent (C).
申请公布号 EP1706791(A4) 申请公布日期 2010.04.21
申请号 EP20050704980 申请日期 2005.01.05
申请人 MICROCHEM CORP.;NIPPON KAYAKU CO., LTD. 发明人 WEBER, WILLIAM;MORI, SATOSHI;HONDA, NAO
分类号 G03F7/038;G03C1/76;G03F7/004;G03F7/11;G03F7/30;G03F7/40 主分类号 G03F7/038
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