发明名称 In-situ crystalline material screening apparatus and method
摘要 <p>There is provided a method and apparatus for assessing in-situ crystal formation in a test sample. Both optical imaging and X-ray diffraction techniques are utilized, with the results of these processes being combined in such a way as to produce an overall score relating to the aptness of crystalline material for harvesting and subsequent X-ray crystallography.</p>
申请公布号 EP1798544(B1) 申请公布日期 2010.04.21
申请号 EP20060125816 申请日期 2006.12.11
申请人 OXFORD DIFFRACTION LIMITED 发明人 KUCHARCZYK, DAMIAN;COOPER, RICHARD;LOEFFEN, PAUL WILLIAM
分类号 G01N23/207 主分类号 G01N23/207
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