发明名称 |
In-situ crystalline material screening apparatus and method |
摘要 |
<p>There is provided a method and apparatus for assessing in-situ crystal formation in a test sample. Both optical imaging and X-ray diffraction techniques are utilized, with the results of these processes being combined in such a way as to produce an overall score relating to the aptness of crystalline material for harvesting and subsequent X-ray crystallography.</p> |
申请公布号 |
EP1798544(B1) |
申请公布日期 |
2010.04.21 |
申请号 |
EP20060125816 |
申请日期 |
2006.12.11 |
申请人 |
OXFORD DIFFRACTION LIMITED |
发明人 |
KUCHARCZYK, DAMIAN;COOPER, RICHARD;LOEFFEN, PAUL WILLIAM |
分类号 |
G01N23/207 |
主分类号 |
G01N23/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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