发明名称 Measuring an appearance property of a surface using a bidirectional reflectance distribution function
摘要 <p>An apparatus for measuring a spatially under-sampled Bidirectional Reflcetance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. </p>
申请公布号 EP2000794(A3) 申请公布日期 2010.04.21
申请号 EP20080157476 申请日期 2008.06.03
申请人 X-RITE INCORPORATED 发明人 NISPER, JON KENNETH;ROOD, PATRICK S.;PAWLANTA, BRETT ALLEN;RICHARDSON, THOMAS M.;TEUNIS, BRIAN DALE
分类号 G01N21/55;G01B11/30;G01J3/46 主分类号 G01N21/55
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