| 摘要 |
A manufacturing method of a semiconductor device includes a step of defining an element region by etching a semiconductor substrate using a first dielectric film as a mask, a step of reducing the first dielectric film by isotropic etching, a step of forming a side wall on a side surface of the reduced first dielectric film, a step of removing the first dielectric film, and a step of forming a trench in the element region by etching using the side wall as a mask to form a plurality of fin portions at the element region.
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