发明名称 High precision voltage source for electrical impedance tomography
摘要 An EIT system includes a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures, voltage source calibration means for calibrating each voltage source, and switching means for individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition. Calibrating respective voltages and currents for each voltage source compensates for shunt impedance of each voltage source. A method for calibrating the system includes individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition for calibrating all of said voltage sources in the same way.
申请公布号 US7701227(B2) 申请公布日期 2010.04.20
申请号 US20050722159 申请日期 2005.12.30
申请人 RENSSELAER POLYTECHNIC INSTITUTE 发明人 SAULNIER GARY J.;LIU NING;ROSS ALEXANDER S.
分类号 G01R35/00;A61B5/05;G01R27/02 主分类号 G01R35/00
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