发明名称 |
High precision voltage source for electrical impedance tomography |
摘要 |
An EIT system includes a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures, voltage source calibration means for calibrating each voltage source, and switching means for individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition. Calibrating respective voltages and currents for each voltage source compensates for shunt impedance of each voltage source. A method for calibrating the system includes individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition for calibrating all of said voltage sources in the same way.
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申请公布号 |
US7701227(B2) |
申请公布日期 |
2010.04.20 |
申请号 |
US20050722159 |
申请日期 |
2005.12.30 |
申请人 |
RENSSELAER POLYTECHNIC INSTITUTE |
发明人 |
SAULNIER GARY J.;LIU NING;ROSS ALEXANDER S. |
分类号 |
G01R35/00;A61B5/05;G01R27/02 |
主分类号 |
G01R35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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