| 发明名称 |
Electronic device testing using a probe tip having multiple contact features |
| 摘要 |
An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the probes. Test data are then communicated to and from the electronic device through the probes.
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| 申请公布号 |
US7701243(B2) |
申请公布日期 |
2010.04.20 |
| 申请号 |
US20080331163 |
申请日期 |
2008.12.09 |
| 申请人 |
FORMFACTOR, INC. |
发明人 |
COOPER TIMOTHY E.;ELDRIDGE BENJAMIN N.;KHANDROS IGOR Y.;MARTENS ROD;MATHIEU GAETAN L. |
| 分类号 |
G01R31/02;G01R31/28 |
主分类号 |
G01R31/02 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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