发明名称 Patterned material layer, method of forming the same, microdevice, and method of manufacturing the same
摘要 A method of forming a patterned material layer, the method comprising: a resist layer forming step of forming a resist layer on a substrate, the resist layer including a first photosensitive resin layer, an intermediate resin layer, and a second photosensitive resin layer; an exposing step; a developing step of partly removing the resist layer so as to form a trench exposing the substrate and partly removing the intermediate resin layer so as to form a groove on a side face of the trench, thereby forming a resist frame; a vacuum coating step of forming a vacuum coating layer having a material pattern part covering the exposed part of the substrate and a part to lift off covering the resist frame; and a liftoff step of removing the part to lift off in the vacuum coating layer together with the resist frame, so as to yield a patterned material layer.
申请公布号 US7700482(B2) 申请公布日期 2010.04.20
申请号 US20060364068 申请日期 2006.03.01
申请人 TDK CORPORATION 发明人 KAMIJIMA AKIFUMI
分类号 H01L21/44 主分类号 H01L21/44
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