DATA COMMUNICATION SYSTEM FOR MEASURING RESIST DISTRIBUTION OF MEMORY CELL AND SEMICONDUCTOR SYSTEM HAVING THE SAME

摘要

PURPOSE: A testing circuit is provided to improve the yield of a memory device by managing the error rate which is obtained by measuring the resistance distribution about a plurality of memory cells. CONSTITUTION: A sensing circuit(50) generates a sensing signal by comparing a reference voltage and a voltage of a sensing node. A digital value generating circuitry answers to the sensing signal outputted from the sensing circuit. A digital value generating circuit(55) generates a digital value corresponding to the RC delay of a bit line. A pre-charge circuit precharges the voltage of the sensor node in response to the pre-charge signal to pre-charge voltage. A sensing amplifier(40) compares the reference voltage received through the first input terminal and a voltage of the sensing node received through the second input terminal. The sensing amplifier generates a sensing signal according to the comparison result.