发明名称 SURFACE INSPECTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a surface inspecting device capable of precisely and efficiently setting a determination threshold by accurately acquiring formation signal at a non-flaw part on production line. Ž<P>SOLUTION: In the surface inspecting device which inspects flaw at the surface of running metal steel strips, a threshold operating part 2 comprises: a concentration histogram operating part 2a acquiring the concentration histogram at every unit area from the image signal; a standard deviation operating part 2b acquiring the standard deviation value of the assumed normal distribution function from the concentration histogram frequency in the vicinity of the peak position by acquiring the peak position of the histogram and assuming the normal distribution function when the peak position is made to be an average value; and a threshold setting part 3 setting a determination threshold corresponding to the standard deviation value. The determination threshold is made to be acquired by maximumly preventing the flaw signal component except the formation signal component from being included in the standard deviation value. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010085096(A) 申请公布日期 2010.04.15
申请号 JP20080250845 申请日期 2008.09.29
申请人 TOSHIBA CORP 发明人 WATANABE YOSHINORI
分类号 G01N21/892;G01B11/30;G06T1/00 主分类号 G01N21/892
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