发明名称 SEMICONDUCTOR DEVICE HAVING REDUCED STANDBY LEAKAGE CURRENT AND INCREASED DRIVING CURRENT AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device includes a semiconductor substrate having an active region which includes a gate forming zone and an isolation region; an isolation layer formed in the isolation region of the semiconductor substrate to expose side surfaces of a portion of the active region including the gate forming zone, such that the portion of the active region including the gate forming zone constitutes a fin pattern; a silicon epitaxial layer formed on the active region including the fin pattern; and a gate formed to cover the fin pattern on which the silicon epitaxial layer is formed.
申请公布号 US2010090290(A1) 申请公布日期 2010.04.15
申请号 US20090638233 申请日期 2009.12.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHEEN DONG SUN;AHN SANG TAE;SONG SEOK PYO;AN HYEON JU
分类号 H01L29/78 主分类号 H01L29/78
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