发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device easily improving the degree of integration of a nonvolatile memory cell even without thoroughly relying on miniaturization by a lithography technology. Ž<P>SOLUTION: This semiconductor device includes: a first insulation region formed on a semiconductor substrate; a first active region formed on the first insulation region; a first nonvolatile memory cell formed on the first active region; a second insulation region formed adjacently to the first insulation region on the semiconductor substrate and having a height smaller than that of the first insulation region in the channel width direction of the first nonvolatile memory cell; a second active region formed on the second insulation region and having an upper surface having a height smaller than that of the first insulation region in the channel width direction; and a second nonvolatile memory cell formed on the second active region and having a channel width direction identical to that of the first nonvolatile memory cell. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010087272(A) |
申请公布日期 |
2010.04.15 |
申请号 |
JP20080255194 |
申请日期 |
2008.09.30 |
申请人 |
TOSHIBA CORP |
发明人 |
KIYOTOSHI MASAHIRO |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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