发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device easily improving the degree of integration of a nonvolatile memory cell even without thoroughly relying on miniaturization by a lithography technology. Ž<P>SOLUTION: This semiconductor device includes: a first insulation region formed on a semiconductor substrate; a first active region formed on the first insulation region; a first nonvolatile memory cell formed on the first active region; a second insulation region formed adjacently to the first insulation region on the semiconductor substrate and having a height smaller than that of the first insulation region in the channel width direction of the first nonvolatile memory cell; a second active region formed on the second insulation region and having an upper surface having a height smaller than that of the first insulation region in the channel width direction; and a second nonvolatile memory cell formed on the second active region and having a channel width direction identical to that of the first nonvolatile memory cell. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010087272(A) 申请公布日期 2010.04.15
申请号 JP20080255194 申请日期 2008.09.30
申请人 TOSHIBA CORP 发明人 KIYOTOSHI MASAHIRO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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