| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a self test adapter (STA) (22) for automatic test equipment (ATE). Ž<P>SOLUTION: The STA includes an enclosure (24). A backplane (26) is housed by the enclosure (24). A dual data bus (62) is integrated into the backplane (26). At least one STA card module (40) is inserted into the backplane (26). The at least one STA card module (40) has a port for interconnection with an ATE station receiver (20). The at least one STA card module (40) includes a generic region adapted for interfacing with an additional STA card module (40) over the dual data bus (62), and a resource specific region (64) adapted for self test of at least one ATE station resource (16, 18). Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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