发明名称 CLEANING AGENT FOR SEMICONDUCTOR SUBSTRATE SURFACE, METHOD OF CLEANING SEMICONDUCTOR DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a cleaning agent for use in a cleaning step after a planarization polishing step in the step of manufacturing a semiconductor device which can remove organic substance pollution and particle pollution in short time on the surface of the semiconductor device, especially on the surface of the semiconductor device on which copper wiring is laid without causing the corrosion of the copper wiring and which can excellently clean the surface of a substrate, and a cleaning method using the same. SOLUTION: A cleaning agent is used after a chemical-mechanical polishing step in the step of manufacturing a semiconductor device on the surface of which copper wiring is laid. The cleaning agent for the surface of a semiconductor substrate contains a specific triazole compound or a specific tetrazole compound as a corrosion inhibitor compound. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010087258(A) 申请公布日期 2010.04.15
申请号 JP20080254930 申请日期 2008.09.30
申请人 FUJIFILM CORP 发明人 NISHIWAKI YOSHINORI;TAKAHASHI KAZUYOSHI;TAKAHASHI TOMOI
分类号 H01L21/304;C11D3/20;C11D3/28;C11D7/26;C11D7/32 主分类号 H01L21/304
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