TEST DEVICE FOR CHARACTERIZING MATERIALS USED FOR OPTICAL STORAGE

摘要

The subject matter is a test device for characterizing a material used in an optical storage medium (10). It comprises a laser source (20) intended to direct an incident laser beam (21) towards the optical storage medium (10), the incident laser beam (21) passing through a focusing objective (22) before reaching the optical storage medium (10) and before being reflected thereat as a reflected laser beam (25). It furthermore comprises a diaphragm (23) for reducing the numerical aperture of the incident laser beam (21) below that of the focusing objective (22), this diaphragm (23) being situated between the laser source (20) and the focusing objective (22) and an interception device (26) for intercepting a cross section of the reflected laser beam (25) after it traverses the focusing objective (22) but before it reaches the diaphragm (23).