| 摘要 |
Provided is a method for measuring the spin resonance phenomenon of an unpaired electron to perform micro evaluation in the state observation of the charge carrier in an organic film interface while receiving light irradiation, or the light emission from an organic thin film element. Also provided are an electron spin measurement device and measurement method in order to improve the characteristics. The electron spin measurement device of the organic thin film element is provided with: at least one sample tube (100) into which a sample (120) is inserted and which is sealed together with specific gas or with vacuum; a cavity resonator (200) into which the at least one sample tube is inserted; an electrical characteristic measurement device (310) for the characteristic evaluation of the organic thin film element which is the sample; wiring (130) for interconnecting the electrical characteristic measurement device (310) and the sample (120) in the sample tube (100); and a light receiving/emitting device (300) for performing the light irradiation to the sample (120), and/or performing the detection of the light emission from the organic thin film element, wherein the cavity resonator irradiates microwaves having the number of vibration corresponding to the Zeeman energy splitting of the unpaired electron, sweeps a magnetic field to the sample tube (100), and measures the transition between the energy levels caused by the reversal of the direction of the electron spin. |
