| 摘要 |
The invention relates to a switching apparatus (1) for electrical contact testing of populated and unpopulated printed circuit boards (12), comprising at least one extensive mount layer (2), a first electrode arrangement (3) and a functional layer (4), wherein the mount layer (2) is elastically restorably deformable and wherein the functional layer (4) is arranged on the first electrode arrangement (3). The functional layer (4) is formed from at least one from the group comprising a layer of a photosensitive material (7), a quantum detector, a photoresistor, and, furthermore, at least one source of electromagnetic radiation (8) is arranged above the functional layer (7), wherein the emitted electromagnetic radiation acts predominantly in the direction of the functional layer (4). The functional layer (4) may also be in the form of a transistor arrangement (9), formed from a plurality of transistors. Furthermore, the invention relates to a method for producing a switching apparatus (1). |
