发明名称 METHOD OF MANUFACTURING SOI SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To improve use efficiency of one semiconductor substrate without lowering efficiency of other fabrication processes, or to achieve cost reduction by effective use of a semiconductor substrate whose thickness is reduced due to repeated use in a process of manufacturing an SOI substrate. SOLUTION: In the process of manufacturing an SOI substrate, a semiconductor substrate is used as a bond substrate a prescribed number of times. Then, a first single crystal semiconductor substrate is bonded to a second single crystal semiconductor substrate, and a stacked-layer substrate formed from the first single crystal semiconductor substrate and the second single crystal semiconductor substrate bonded to each other is used as a bond substrate in a process of manufacturing an SOI substrate. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010087492(A) 申请公布日期 2010.04.15
申请号 JP20090201771 申请日期 2009.09.01
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ENDO YUTA;IMABAYASHI RYOTA;MURATA RYOSUKE
分类号 H01L21/02;H01L21/322;H01L27/12 主分类号 H01L21/02
代理机构 代理人
主权项
地址