| 摘要 |
PROBLEM TO BE SOLVED: To reduce the costs of element tests, and to improve the work efficiency. SOLUTION: The contact pin 1 is mounted to an element-testing apparatus used for testing the electrical characteristics of electronic components, such as a semiconductor device, and a contact part 12a of the contact pin 1 to be brought into contact with electrodes of the electronic parts can be characteristically detached and attached. By using the element-testing apparatus to which such a contact pin 1 is mounted, it is possible to accurately perform element testings, reduce the cost of the element tests and improve the working efficiency. COPYRIGHT: (C)2010,JPO&INPIT
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