SEMICONDUCTOR INTEGRATED CIRCUIT AND ELECTRONIC DEVICE

摘要

<P>PROBLEM TO BE SOLVED: To precisely measure characteristics deterioration of MOSFET by a comparatively simple circuit configuration. Ž<P>SOLUTION: A semiconductor integrated circuit includes: a first ring oscillator 11 to which a stress voltage is applied; a second ring oscillator 12 to which the stress voltage is not applied; and a phase comparator 13 that receives the outputs of the first ring oscillator and second ring oscillator and compare the phases thereof. The first ring oscillator 11 includes a switching circuit 110 that switches a first connection status where a predetermined node of the second ring oscillator and that of the first ring oscillator are connected after disconnecting a ring connection of the first ring oscillator and a second connection status where the first ring oscillator is ring-connected after disconnecting the connection of the first ring oscillator and the second ring oscillator. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž