发明名称 CORRECTION CIRCUIT AND TEST DEVICE
摘要 Provided is a correction circuit which includes: a first detection unit which detects a waveform of an input signal; an amplification unit which amplifies a waveform detected by a first detection unit; a correction signal generation unit which extracts an AC component of a waveform amplified by an amplification unit and generates a correction signal; an output signal generation unit which superposes a correction signal on an input signal waveform and generates an output signal. The first detection unit detects an input signal waveform and a reversed waveform. The amplification unit amplifies the input signal waveform and the reversed waveform. The correction signal generation unit extracts an AC component from the input signal waveform and the reversed waveform which have been amplified by the amplification unit and generates a correction signal and a reversed correction signal. The output signal generation unit superposes a correction signal on the input signal waveform and superposes a reversed correction signal on the input signal reversed waveform, so as to generate a differential signal pair of the output signal.
申请公布号 KR20100039377(A) 申请公布日期 2010.04.15
申请号 KR20107002206 申请日期 2008.07.09
申请人 ADVANTEST CORPORATION 发明人 KUWANA YUJI;MATSUMOTO NAOKI
分类号 G01R31/3183;G01R31/26 主分类号 G01R31/3183
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