发明名称 METHOD OF FORMING INSULATING COATING AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method of forming an insulating coating to a semiconductor which can also cope with the formation of a thick insulating coating by a chemical oxidation film forming method, and also a method of manufacturing a semiconductor device using the coating forming method. <P>SOLUTION: The formation of an insulating coating and the manufacturing of a semiconductor device using the coating formation can be achieved in a practical short time by a method of chemically forming a thick silicon oxide film 4 on a silicon substrate 1 to be treated by immersing a base material for coating formation containing a silicon oxide in its surface, silicon, or a solid containing silicon or a solid coated with a film containing silicon into an oxidizing solution, and heating the oxidizing solution at a temperature not higher than the boiling point of the oxidizing solution to form a dense silicon oxide film on the base material. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010087458(A) 申请公布日期 2010.04.15
申请号 JP20090025764 申请日期 2009.02.06
申请人 KOBAYASHI HIKARI 发明人 KOBAYASHI HIKARI;YANASE TAKASHI
分类号 H01L21/316;H01L29/78 主分类号 H01L21/316
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