| 摘要 |
Described herein are methods that may improve yield of an image sensor. In one embodiment, a method that may improve yield of an image sensor includes generating output values of control logic associated with an array of light sensitive elements. The method further may include determining if the control logic has one or more faulty output values. The method further may include automatically correcting the one or more faulty output values. In another embodiment, a method that may improve yield of an image sensor includes providing light to an array of light sensitive elements. The method further may include generating an image based on the light sensitive elements and associated control logic. The method further may include disconnecting control lines from control logic that has one or more faulty output values based on viewing the image. The method further may include generating another image based on the control logic having no faulty output values.
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