发明名称 A METHOD OF GAIN CALIBRATION OF AN ADC STAGE AND AN ADC STAGE
摘要 <p>A method of gain calibration of an ADC stage is disclosed. The method comprises receiving an input analog signal, converting the input analog signal into an m-bit digital signal by means of an analog to digital converter, generating a calibration signal by means of a random number generator, adding the calibration signal to the m-bit digital signal to produce an adjusted m-bit digital signal, converting the adjusted m-bit digital signal into an adjusted partial analog signal by means of a digital to analogue converter, subtracting the partial analog signal from the input analog signal, to produce a residual analog signal, amplifying the residual analog signal. The method is characterised in that the calibration signal may take any one of three values. In a preferred embodiment, the calibration is constrained to one of only two of these three values, when the input signal is in an outermost sub-range. An ADC stage adapted to operate according to the method is also disclosed.</p>
申请公布号 WO2010041187(A1) 申请公布日期 2010.04.15
申请号 WO2009IB54340 申请日期 2009.10.05
申请人 NXP B.V.;ERDMANN, CHRISTOPHE 发明人 ERDMANN, CHRISTOPHE
分类号 H03M1/06 主分类号 H03M1/06
代理机构 代理人
主权项
地址