发明名称 METHOD FOR FORMATION OF CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a capacitor of a semiconductor device is provided to improve reliability by forming a conformal dielectric layer on the lower electrode. CONSTITUTION: A hole is formed inside a mold layer on a semiconductor substrate. The first conductive layer is formed on the semiconductor substrate including a hole. A first layer(132) is formed on the only lower side of the hole on the first conductive layer. A second conductive layer is formed on the semiconductor substrate to cover the first film. A first conductive layer and a second conductive layer are left inside the hole. The first and second conductive layers are removed on the mold layer. The exposed mold layer is removed with the first conductive layer and the second conductive layer. A dielectric layer(134) are formed on the exposed first and second conductive layers. A third conductive layer(135) is formed on the dielectric layer.
申请公布号 KR20100038978(A) 申请公布日期 2010.04.15
申请号 KR20080098161 申请日期 2008.10.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH, SE HOON;CHOI, HOON SANG;IM, KI VIN;KANG, SANG YEOL;YOO, CHA YOUNG
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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