发明名称 IMPULSE IMMUNITY TEST APPARATUS
摘要 The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.
申请公布号 US2010090710(A1) 申请公布日期 2010.04.15
申请号 US20080530168 申请日期 2008.03.06
申请人 NEC CORPORATION;NEC ELECTRONICS CORPORATION;HANWA ELECTRONIC IND. CO., LTD. 发明人 TSUKAGOSHI TSUNEO;WATANABE TAKESHI;NAKAIE TOSHIYUKI;MATSUI NOBUCHIKA
分类号 G01R27/28 主分类号 G01R27/28
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