发明名称 |
INSPECTION SYSTEM, INSPECTION METHOD OF INSPECTION SYSTEM, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To automate information extraction of an inspection system; to reduce operation man-hours; and to improve reliability. SOLUTION: In this inspection system equipped with a device to be inspected having two or more inspection objects to be inspected, and an inspection device for determining an abnormality of a detection result of the inspection objects by a sensor, the inspection objects and a parameter which is a threshold for determining a detection result to be abnormal are changed to be correlated. COPYRIGHT: (C)2010,JPO&INPIT
|
申请公布号 |
JP2010085184(A) |
申请公布日期 |
2010.04.15 |
申请号 |
JP20080253196 |
申请日期 |
2008.09.30 |
申请人 |
NEC PERSONAL PRODUCTS CO LTD |
发明人 |
KATO KATSUTOSHI;KANDA YOSUKE;KIKUCHI NORIYUKI |
分类号 |
G01H17/00 |
主分类号 |
G01H17/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|