发明名称 INSPECTION SYSTEM, INSPECTION METHOD OF INSPECTION SYSTEM, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To automate information extraction of an inspection system; to reduce operation man-hours; and to improve reliability. SOLUTION: In this inspection system equipped with a device to be inspected having two or more inspection objects to be inspected, and an inspection device for determining an abnormality of a detection result of the inspection objects by a sensor, the inspection objects and a parameter which is a threshold for determining a detection result to be abnormal are changed to be correlated. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010085184(A) 申请公布日期 2010.04.15
申请号 JP20080253196 申请日期 2008.09.30
申请人 NEC PERSONAL PRODUCTS CO LTD 发明人 KATO KATSUTOSHI;KANDA YOSUKE;KIKUCHI NORIYUKI
分类号 G01H17/00 主分类号 G01H17/00
代理机构 代理人
主权项
地址