发明名称 |
APPARATUS FOR MEASURING CHIP LEAKAGE CURRENT AND TEMPERATURE |
摘要 |
Device for measuring temperature and leakage current in a chip, which provides an output which linearly varies with the temperature. The device comprises a leakage inverter and an electronic module which digitalizes and linearizes the non-linear output of the leakage inverter. When providing a linear response, the need for storage and data interconnection is reduced, besides the numeric representation thereof is facilitated. The device can be used to measure temperature variations inside a chip and also to measure leakage current variations, which also entails measuring static power variations inside a chip.
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申请公布号 |
EP2175288(A1) |
申请公布日期 |
2010.04.14 |
申请号 |
EP20080805308 |
申请日期 |
2008.07.07 |
申请人 |
UNIVERSIDAD POLITECNICA DE MADRID |
发明人 |
ITUERO HERRERO, PABLO;AYALA RODRIGO, JOSE LUIS;LOPEZ VALLEJO, MARISA |
分类号 |
G01R31/30 |
主分类号 |
G01R31/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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