发明名称 Apparatus for inspecting property of light emitting diode
摘要 An apparatus for inspecting characteristics of a light emitting diode is provided to measure characteristics of the light emitting diode as well as characteristics of a module by including a switching unit. An inspection apparatus(100) includes a plurality of light emitting diodes(30), a driving board(15), a power supply unit(29), a switching unit(28), and an inspection unit(20). The light emitting diodes are installed in the driving board. The power supply unit supplies the power to the light emitting diodes. The switching unit is connected between the driving board and the power supply unit. The switching unit connects selectively the light emitting diodes. The inspection unit measures characteristics of the light emitting diodes.
申请公布号 KR100952028(B1) 申请公布日期 2010.04.14
申请号 KR20080005685 申请日期 2008.01.18
申请人 发明人
分类号 H01L33/62 主分类号 H01L33/62
代理机构 代理人
主权项
地址