| 摘要 |
A gas sorption sample chamber contains a plurality of thin-film substrates and fluidly couple said substrates to a Sieverts' device or other gas sorption analyzer. The thin-film substrates are held in proximity to each other in the sample chamber in a columnar arrangement, either in a stacked or slightly spaced configuration, to reduce free-gas volume in the sample chamber, thereby improving sorption test accuracy. The interior geometry of the chamber is configured to provide a minimal clearance between the thin-film substrates and the internal surfaces of the chamber, so that essentially all of the chamber volume is occupied by thin-film sample material and inactive substrate material. To facilitate use in a glove box, the chamber may be configured with a removable sample cartridge in which thin-film substrates are placed so that all substrates may be loaded and unloaded as a group. |
