发明名称 Phase change memory devices having dual lower electrodes
摘要 A semiconductor device includes a semiconductor substrate and a lower interlayer insulating layer disposed on the substrate. An opening passing through the lower interlayer insulating layer and exposing the substrate is included. A buried insulating pattern is disposed in the opening. First and second conductive layer patterns are sequentially stacked to surround the sidewall and bottom of the buried insulating pattern. A phase change material pattern is included, which is disposed on the lower interlayer insulating layer in contact with a top surface of the second conductive layer pattern, and spaced apart from the first conductive layer pattern. An upper interlayer insulating layer covering the lower interlayer insulating layer and the phase change material pattern is included. A conductive plug is included, which passes through the upper interlayer insulating layer and is electrically connected to the phase change material pattern. A method of fabricating the semiconductor device is also provided.
申请公布号 US7696508(B2) 申请公布日期 2010.04.13
申请号 US20070932781 申请日期 2007.10.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG YOON-JONG;RYOO KYUNG-CHANG;LIM DONG-WON
分类号 H01L29/43 主分类号 H01L29/43
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