发明名称 Polishing compound for semiconductor integrated circuit device, polishing method and method for producing semiconductor integrated circuit device
摘要 To provide a technique employed when a plane to be polished of a silicon dioxide type material layer is polished in production of a semiconductor integrated circuit device, which is capable of polishing protruded portions by priority while suppressing polishing at recessed portions and planarizing the plane to be polished at a high level with an extremely small polishing amount, with small pattern dependence of the polishing rate. In production of a semiconductor integrated circuit device, when a plane to be polished is a plane to be polished of a silicon dioxide type material layer, a polishing compound containing cerium oxide particles, a water-soluble polyamine and water is used as a polishing compound for chemical mechanical polishing to polish the plane to be polished.
申请公布号 US7695345(B2) 申请公布日期 2010.04.13
申请号 US20070863852 申请日期 2007.09.28
申请人 ASAHI GLASS COMPANY, LIMITED;AGC SEIMI CHEMICAL CO., LTD. 发明人 YOSHIDA IORI;KON YOSHINORI
分类号 B24B1/00;B24B37/00;H01L21/302;H01L21/304 主分类号 B24B1/00
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