发明名称 Methods of forming capacitors
摘要 A method of forming a capacitor includes providing material having an opening therein over a node location on a substrate. A shield is provided within and across the opening, with a void being received within the opening above the shield and a void being received within the opening below the shield. The shield is etched through within the opening. After the etching, a first capacitor electrode is formed within the opening in electrical connection with the node location. A capacitor dielectric and a second capacitor electrode are formed operatively adjacent the first capacitor electrode.
申请公布号 US7696056(B2) 申请公布日期 2010.04.13
申请号 US20080114129 申请日期 2008.05.02
申请人 MICRON TECHNOLOGY, INC. 发明人 KIEHLBAUCH MARK;SHEA KEVIN
分类号 H01L21/20;H01L27/108 主分类号 H01L21/20
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