发明名称 Inspection System for External Electrode Fluorescent Lamp
摘要 An inspection apparatus for automating defect inspection of an EEFL(External Electrode Fluorescent Lamp) is provided to detect the defect of the EEFL by using a plurality of cameras with strain viewer filters. A vibrator includes a second receiving piece, a fixing plate(15), first and second support plates(17,18), a rotator, a cylinder, a plurality of guides and a vibrator. A second receiving piece receives a plurality of fluorescent lamps. The fixing plate prevents the separation of a plurality of fluorescent lamps from the second receiving piece. A first support plate supports the second receiving piece. The rotator induces the incline of the second receiving piece to a required direction. The cylinder implements the movement of a first support plate. The second support plate move up and down by a cylinder and a cylinder rod. A plurality of guides are arranged in the position adjacent to both sides of the cylinder. The vibrator implements repetitive vibration in the lower part of the second receiving piece.
申请公布号 KR100951887(B1) 申请公布日期 2010.04.12
申请号 KR20080000199 申请日期 2008.01.02
申请人 发明人
分类号 H05B37/03;H01J9/42;H01J65/00;H05B41/24 主分类号 H05B37/03
代理机构 代理人
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