发明名称 HEAT TREATMENT APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 Provided is a heat treatment apparatus including a treatment chamber housing a silicon substrate, a heater being provided in the treatment chamber and heating the silicon substrate, and an atmosphere adjustment mechanism reducing a concentration of oxygen contained in an atmosphere inside the treatment chamber to less than an oxygen concentration in the air. The atmosphere adjustment mechanism is provided with an oxygen trap, for example.
申请公布号 US2010087014(A1) 申请公布日期 2010.04.08
申请号 US20090633029 申请日期 2009.12.08
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 NAGAI KOUICHI
分类号 H01L21/02;F27B9/04;F27D7/00;H01L21/31;H01L21/66;H01L21/78 主分类号 H01L21/02
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