发明名称 MASK, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a mask for suppressing an exposure defect, and to provide an exposure method, and a device manufacturing method. <P>SOLUTION: The mask M is used, which includes a pellicle frame 120 for correcting non-linear deformation, which is caused in the temperature distribution of a mask body 100, to be linear deformation. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010078921(A) 申请公布日期 2010.04.08
申请号 JP20080247256 申请日期 2008.09.26
申请人 NIKON CORP 发明人 YOSHIMOTO HIROMITSU
分类号 G03F1/50;G03F1/64;G03F7/20;H01L21/027 主分类号 G03F1/50
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