| 摘要 |
PROBLEM TO BE SOLVED: To reduce the number of wires between a scanning circuit and a plurality of scan lines using a circuit configuration simpler than conventional circuit configurations. SOLUTION: Scan lines are divided into Kn×...×k2 groups wherein N is an integer of 2 of more, and gate wires of first to Nth groups comprising kn (1≤kn≤N) gate wires are provided. A scan line driving circuit outputs a first selection scan voltage for selecting scan lines in each group for each one horizontal scan period, to gate wires of k1 first groups; outputs a second selection scan voltage for selecting scan lines in one of groups in the second stage having k2 groups as one unit for each one horizontal scan period, to gate wires of k2 second groups; and outputs an m-th selection scan voltage for selecting scan lines in one of groups in the m-th stage having k(m-1) groups in the (m-1)th stage as one unit at intervals of (k(m-1)×...×k1) horizontal scan periods, to gate wires of km m-th groups, wherein m is an integer of 3 to N. COPYRIGHT: (C)2010,JPO&INPIT |
