发明名称 LITHOGRAPHIC APPARATUS AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus and method for improving performance, efficiency, and/or a function of a device manufactured by using lithography. <P>SOLUTION: A lithographic method includes a step of using information at least indicative of a desired shape or size of a constituent part of a device to implement the desired shape or size of the constituent part of the device. The desired shape or size is related to a measured property of a layer of material in which the constituent part of the device is to be created. At least a part of the implementation process comprises a step of determining a configuration of a plurality of individually controllable elements that would be necessary to create in a radiation beam a pattern which is sufficient to implement the desired shape or size of the constituent part of the device when creating the constituent part of the device. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010080961(A) 申请公布日期 2010.04.08
申请号 JP20090215328 申请日期 2009.09.17
申请人 ASML NETHERLANDS BV 发明人 IOSAD NIKOLAY NIKOLAEVICH;GUI CHENG-QUN
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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