| 摘要 |
PURPOSE: An electronic component test system is provided to improve the effectiveness of a test process by using a same carrier board for mediating the electrical contact between an electronic component and a tester. CONSTITUTION: A first tester executes a first test(510) process about an electronic component. A first handler(520) is used for electrically connecting an electronic component to the first tester. A second tester executes a second test(530) process about the electronic component which is tested by the first tester. A second handler(540) is used for electrically connecting an electronic component to the second tester. A carrier board is carried with the first handler and the second handler and mediates electrical connection between the electronic component, the first tester, and the second tester. |
