Two frequency system for measuring a property of a dielectric material having a single amplifying and detecting circuit for both frequencies,申请号US19630268909-传众专利搜索

发明名称	Two frequency system for measuring a property of a dielectric material having a single amplifying and detecting circuit for both frequencies
摘要
申请公布号	US3327207(A)	申请公布日期	1967.06.20
申请号	US19630268909	申请日期	1963.03.29
申请人	INDUSTRIAL NUCLEONICS CORPORATION	发明人	NORWICH ALAN
分类号	G01N27/22	主分类号	G01N27/22
代理机构		代理人
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