发明名称 |
MICROELECTRONIC SENSOR DEVICE FOR OPTICAL EXAMINATIONS ON A WETTED SURFACE |
摘要 |
A method and a microelectronic sensor device for making optical examinations in an investigation region at the contact surface of a carrier, wherein an input light beam is sent from a light source towards the investigation region, and wherein an output light beam coming from the investigation region is detected by a light detector. An evaluation unit that is coupled to the light detector is adapted to determine the wetting grade of the investigation region based on a characteristic parameter of the output light beam. The evaluation unit may be adapted to determine a change in the light intensity caused by a liquid contacting the contact surface. The wetting grade may be detected in a test region that is located adjacent to the investigation region and that has a higher roughness than the investigation region. |
申请公布号 |
EP2171431(A1) |
申请公布日期 |
2010.04.07 |
申请号 |
EP20080776461 |
申请日期 |
2008.06.24 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
VERSCHUREN, COEN, A.;IMMINK, ALBERT, H., J. |
分类号 |
G01N21/552;G01N21/11;G01N21/64 |
主分类号 |
G01N21/552 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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