发明名称 Lithography projection objective, and a method for correcting image defects of the same
摘要 Projection objectives, as well as related components, systems and methods, are disclosed. In general, a projection objective is configured to image radiation from an object plane to an image plane. A projection objective can include a plurality of optical elements along the optical axis. The plurality of optical elements can include a group of optical elements and a last optical element which is closest to the image plane, and a positioning device configured to move the last optical element relative to the image plane. Typically, a projection objective is configured to be used in a microlithography projection exposure machine.
申请公布号 US7692868(B2) 申请公布日期 2010.04.06
申请号 US20080265090 申请日期 2008.11.05
申请人 CARL ZEISS SMT AG 发明人 LOERING ULRICH;BLAHNIK VLADAN;ULRICH WILHELM;KRAEHMER DANIEL;WABRA NORBERT
分类号 G02B9/00;G03B27/42;G03F7/00 主分类号 G02B9/00
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