发明名称 Apparatus for detecting a current and temperature for an integrated circuit
摘要 The present invention discloses an apparatus for detecting a current flowing from a first node to a second node. One or more MOS devices are serially coupled between the first and second nodes. Each of the MOS devices has its body connected to its source and its gate connected to its drain for providing each MOS device with a voltage difference between its gate and its source that is lower than a threshold voltage of the same, such that a voltage difference measured between the first and second nodes responds to a change of the current exponentially.
申请公布号 US7692442(B2) 申请公布日期 2010.04.06
申请号 US20050281142 申请日期 2005.11.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHEN CHUNG-HUI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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