发明名称 DEFECT INSPECTING METHOD AND DEFECT INSPECTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a technology that does not incorrectly recognize a part other than a defective part as defective even when the shape of a surface varies irregularly during imaging. Ž<P>SOLUTION: (A) When a flexible sheet-like article or the like is imaged while being conveyed, concentration irregularity can be generated in an image by deformation during conveyance. The whole image is divided into two inspection regions A1 and A2, the most frequent value (150) of the concentration is determined in an inspection region A1, a pixel of a concentration lower than the most frequent value is extracted, and adjacent pixels are coupled to each other. The coupled pixels are set as a processing area AD, and the maximum value (100) of the concentration among them is determined. (B) Then, the concentration in the processing area AD is gradation-corrected with the ratio (150/100) of the most frequent value and the maximum value, the influence of shape variation is removed, and then a defect is inspected. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010071876(A) 申请公布日期 2010.04.02
申请号 JP20080241291 申请日期 2008.09.19
申请人 KYODO PRINTING CO LTD 发明人 SAITO SHUICHI
分类号 G01N21/892;G01N21/88 主分类号 G01N21/892
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