| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an apparatus and method for determining surface properties. Ž<P>SOLUTION: An apparatus (1) for determining surface properties includes: at least a first radiation device (3) which emits radiation onto a surface (8) to be analyzed; at least a first radiation detector device (5) which receives at least part of the radiation emitted by the at least one radiation device (3) and then scattered and/or reflected by the surface (8) and outputs at least a first measurement signal which is characteristic of the reflected and/or scattered radiation; and at least a second radiation detector device (7) which receives at least part of the radiation emitted by the at least one radiation device (3) and then scattered and/or reflected by a surface (8) and outputs at least a further measurement signal which is characteristic of the reflected and/or scattered radiation. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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