| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a test data generation device and a test data generation method, allowing generation of test data of an effective date. <P>SOLUTION: The test data generation device previously stores basic test data wherein information related to a date is configured by a date function, substitutes information showing a test day inputted by an operator for the date function of the stored basic test data to generate the test data, and outputs the generated test data. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
