发明名称 FIELD EFFECT TRANSISTOR, MEMORY CELL, AND METHOD FOR MANUFACTURING FIELD EFFECT TRANSISTOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a field effect transistor (FET) for preventing the active areas from being taken down or deformed in a washing step. <P>SOLUTION: In the configuration of FET, four pillar active areas each including a part in which a channel is generated during the operation of FET are provided on the surface of a semiconductor substrate, wherein the pillar active areas are separated each other by a beam field oxide film 8, gate electrodes 11a and 11b are provided via an gate insulating film 10 so as to contact the side surfaces of the pillar active areas, an upper diffusion layer 14d corresponding to a drain electrode is provided on the top surfaces of the pillar active areas, and lower diffusion layers 9a, 9b, 9c and 9d corresponding to source electrodes are provided on the surface of the silicon substrate 1. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010073879(A) 申请公布日期 2010.04.02
申请号 JP20080239494 申请日期 2008.09.18
申请人 ELPIDA MEMORY INC;HIROSHIMA UNIV 发明人 SUNAMI HIDEO;SUGIMURA ATSUSHI;OKUYAMA KIYOSHI;OYU SHIZUNORI;MIYAKE HIDEJI
分类号 H01L29/78;H01L21/336;H01L21/8234;H01L21/8242;H01L21/8246;H01L27/088;H01L27/10;H01L27/105;H01L27/108;H01L29/739;H01L45/00 主分类号 H01L29/78
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