发明名称 PROBE AND MEASUREMENT SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a probe allowing its delay time to be adjusted. Ž<P>SOLUTION: First and second probes 10A and 10B have an adjustment domain provided with a plurality of spaces for inserting the first and second probes 10A and 10B into each other with an electrical connection held between first and second inner conductors 11 and 21, an electrical connection held between first and second outer conductors 13 and 23, and insulation held between the inner conductors 11 and 21 while between the outer conductors 13 and 23. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010071887(A) 申请公布日期 2010.04.02
申请号 JP20080241537 申请日期 2008.09.19
申请人 TOSHIBA CORP 发明人 MASAOKA YASUSHI
分类号 G01R1/067;G01R13/20 主分类号 G01R1/067
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