| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a bending resistance testing machine capable of precisely evaluating the bending resistance of a waveguide. Ž<P>SOLUTION: In the bending resistance testing machine 10, a light detecting part 16 is provided at a position capable of detecting the light emitted from the end face 22C on the light emitting side of the waveguide 22 when the waveguide 22 is reciprocally rocked in a bending region 22A to be bent at an angle prescribed as a measuring condition and the quantity of the light is detected by the optical sensor 16A of the light detecting part 16. The end face 22C on the light emitting side of the waveguide 22 and the light detecting part 16 are not directly brought into contact with each other and provided so as to leave an interval so that the light emitted from the end face 22C on the light emitting side of the waveguide 22 may be detected by the light detecting part 16 only when the waveguide 22 is bent at a predetermined angle. A point of time when the detected quantity of light becomes the reference quantity of light or below is identified as the life to the bending of the waveguide 22. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
