发明名称 COMPOSITION FOR FORMATION OF ANTIREFLECTION FILM AND PATTERN FORMATION METHOD USING THE SAME
摘要 The present invention provides a composition for forming a top anti-reflection coating having such a low refractive index that it can be suitably used in pattern formation with an ArF excimer laser beam, and further the invention also provides a pattern formation method employing that composition. The top anti-reflection coating composition comprises a particular naphthalene compound, a polymer, and a solvent. The composition is used for forming a top anti-reflection coating provided on a photoresist layer. From the photoresist layer, a pattern can be formed by use of light in 160 to 260 nm.
申请公布号 US2010081087(A1) 申请公布日期 2010.04.01
申请号 US20070448517 申请日期 2007.12.21
申请人 KURAMOTO KATSUTOSHI;KOBAYASHI MASAKAZU;AKIYAMA YASUSHI 发明人 KURAMOTO KATSUTOSHI;KOBAYASHI MASAKAZU;AKIYAMA YASUSHI
分类号 G03F7/00;C08K5/16;C08K5/18;C08K5/43;G03C1/00 主分类号 G03F7/00
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